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mil-m-38510/60b 8 december 2004 superseding mil-m-38510/60a 5 august 1985 military specification microcircuits, digital, ecl, multiple nor gates, monolithic silicon this specification is approved for use by all departments and agencies of the department of defense. the requirements for acquiring the product herein shall consist of this specificat ion sheet and mil-prf 38535. 1. scope 1.1 scope. this specification covers the detail requirements for monolithic silicon, ecl, logic gating microcircuits. two product assurance classes and a choice of case outli nes and lead finishes are provided for each type and are reflected in the complete part number. for this produc t, the requirements of mil-m- 38510 have been superseded by mil-prf-38535, (see 6.3). 1.2 part or identifying number (pin). the pin is in accordance with mil-prf-38535, and as specified herein. 1.2.1 device types. the device types are as follows: device type circuit 01 quad or/nor gate with strobe 02 triple nor gate, single or/nor gate 03 triple 2-3-2 or/nor gate 04 triple 3-4-3 nor gate 05 triple exclusive or/nor gate 06 dual 4-5 or/nor gate 1.2.2 device class. the device class is the product assu rance level as defined in mil-prf-38535. 1.2.3 case outlines. the case outlines are as designated in mil-std-1835 and as follows: outline letter descriptive designator terminals package style e gdip1-t16 or cdip2-t16 16 dual-in-line f gdfp2-f16 or cdfp3-f16 16 flat 2 cqcc1-n20 20 square chip carrier comments, suggestions, or questions on this docum ent should be addressed to: commander, defense supply center, columbus, attn: dscc-vas, p.o. box 3990, columbus, oh 43218-3990, or emailed to bipolar@dla.mil . since contact information can change, you ma y want to verify the currency of this address information using the assi st online database at http://assist.daps.dla.mil . amsc n/a fsc 5962 inch-pound inactive for new design after 8 july 1997.
mil-m-38510/60b 2 1.3 absolute maximum ratings. supply voltage range ............................................................................. 0 v dc to -7.0 v dc input voltage range 0 v dc to ?5.2 v dc storage temperatur e range .................................................................... -65 to +150 c maximum power dissipation, (p d ) 1 / ...................................................... 55 mw lead temperature (soldering, 10 se conds) ............................................. +260 c junction temperature (t j ) 2 / ................................................................... 165 c maximum output cu rrent ........................................................................ -50 ma thermal resistance, junction to case ( jc ): cases e, f, and 2 ............................................................................... (see mil-std-1835) 1.4 recommended operating conditions. supply voltage (v ee ) ...................................................................... -5. 46 v minimum to ?4.94 v maximum minimum high level input voltage ................................................... -1 .105 v at t c = 25 c (at 500 linear feet per mi nute) (ft/min ) ........................................ -1. 000 v at t c = 125 c ................................................................................................. -1 .255 v at t c = -55 c maximum low level input vo ltage ................................................... -1 .475 v at t c = 25 c (at 500 linear ft/m in) ................................................................... -1. 400 v at t c = 125 c ................................................................................................. -1 .510 v at t c = -55 c normalized fanout (each ou tput) ..................................................10 3 / operating temperature range (t c ).................................................. -55 to +125 c (at 500 linear ft/min) 2. applicable documents 2.1 general . the documents listed in this section are specified in sections 3, 4, or 5 of this specification. this section does not include documents cited in other sections of this specification or recommended for additional information or as examples. while every effort has been made to ensure the completeness of this list, document users are cautioned that they must meet all specified requirements of documents cited in sections 3, 4, or 5 of this specific ation, whether or not they are listed. 2.2 government documents. 2.2.1 specificat ions and standards . the following specifications a nd standards form a part of this specification to the extent specified herein. unless otherwise specified, th e issues of these documents are those cited in the solicitation or contract. department of defe nse specifications mil-prf-38535 - integrated circuits (microcircuit s) manufacturing, general specification for. _______ 1 / must withstand the added p d due to short-circuit test (e.g., i os ). 2 / maximum junction temperature should not be exceeded except in accordance with allowable short duration burn-in screening condition in accordance with mil-prf-38535. 3 / device will fanout in both high and low levels to the specified number of dat a inputs on the same device type as that being tested.
mil-m-38510/60b 3 department of defense standards mil-std-883 - test method standard for microelectronics. mil-std-1835 - interface standard elec tronic component case outlines (copies of these documents are available online at http://assist.daps.dla .mil/quicksearch/ or http://assist.daps.dla.mil or from the standardization document or der desk, 700 robbins avenue, building 4d, philadelphia, pa 19111-5094.) 2.3 order of precedence. in the event of a conflict between the text of this specification and the references cited herein, the text of this document takes preced ence. nothing in this document, however, supersedes applicable laws and regulations unless a specific exemption has been obtained. 3. requirements 3.1 qualification . microcircuits furnished under this specificati on shall be products that are manufactured by a manufacturer authorized by the qualifying activity for listi ng on the applicable qualifi ed manufacturers list before contract award (see 4.3 and 6.4). 3.2 item requirements . the individual item requirements shall be in accordance with mil-prf-38535 and as specified herein or as modified in the device manufactu rer's quality management (qm) plan. the modification in the qm plan shall not affect the form, fit, or function as described herein. 3.3 design, construction, and physical dimensions. the design, construction, and physical dimensions shall be as specified in mil-prf-38535 and herein. 3.3.1 terminal connections and logic diagrams. the terminal connections and logic diagrams shall be as specified on figure 1. 3.3.2 truth tables and logic equations. the truth tables and logic equations shall be as specified on figure 2. 3.3.3 schematic circuits. the schematic circuits shall be maintained by the manufacturer and made available to the qualifying activity and the preparing activity upon request. 3.3.4 case outlines . case outlines shall be in accordance with 1.2.3. 3.4 lead material and finish . lead material and finish shall be in accordance with mil-prf-38535 (see 6.6). 3.5 electrical performance characteristics . the electrical performance ch aracteristics are as specified and table i and apply over the full recommended case operating range unless otherwise specified.
mil-m-38510/60b 4 table i. electrical performance characteristics. (limits are valid provided circuit is in a test socket and transverse air flow of 500 linear ft/min is maintained.) test symbol conditions device limits unit -55 c t c +125 c types min max t c v ih1 v il1 high level output voltage v oh v ee = -5.2 v, v cc = 0 v, load = 100 ? to ?2v 25 c 125 c -55 c -0.780 v -0.630 v -0.880 v -1.850 v -1.820 v -1.920 v all -0.930 -0.825 -1.080 -0.780 -0.630 -0.880 v t c v ih1 v il1 low level output voltage v ol v ee = -5.2 v, v cc = 0 v, load = 100 ? to ?2v 25 c 125 c -55 c -0.780 v -0.630 v -0.880 v -1.850 v -1.820 v -1.920 v all -1.850 -1.820 -1.920 -1.620 -1.545 -1.655 v t c v ith v itl high level threshold output voltage v oth v ee = -5.2 v, v cc = 0 v, load = 100 ? to ?2v 25 c 125 c -55 c -1.105 v -1.000 v -1.255 v -1.475 v -1.400 v -1.510 v all -0.950 -0.845 -1.100 - - - - - - - - - v t c v ith v itl low level threshold output voltage v otl v ee = -5.2 v, v cc = 0 v, load = 100 ? to ?2v 25 c 125 c -55 c -1.105 v -1.000 v -1.255 v -1.475 v -1.400 v -1.510 v all - - - - - - - - - -1.600 -1.525 -1.635 v 01, 02 -29 power supply drain i ee v ee = -5.2 v, 03, 04 -24 ma current v cc = 0 v 05 -31 06 -16 i ih1 v ee = -5.2 v, v cc = 0 v, all - - - 450 1 / a high level input v ih1 = -0.780 v at 25 c, -0.630 v at 125 c, - - - current i ih2 -0.880 v at -55 c 01 - - - 935 2 / a 05 - - - 375 low level input i il v ee = -5.2 v, v cc = 0 v, all 0.3 a current v il1 = -1.850 v at 25 c, -1.820 v at 125 c, -1.920 v at -55 c see footnotes at end of table.
mil-m-38510/60b 5 table i. electrical performance characteristics ? continued. test symbol conditions device limits unit -55 c t c +125 c types min max v eel = -3.2 v, v cc = +2.0 v, 01, 02, transition time, t tlh rl 03, 04, 1.0 4.0 ns low to high level 2 = 50 ? , cl 5 pf (output under test) 06 load = 100 ? to gnd (outputs not under test) 05 1.0 4.3 ns device type 05 only : v ih2 = +1.11 v v il2 = +0.31 v 01, 02, transition time, t thl 03, 04, 1.0 4.0 ns high to low level 06 05 1.0 4.3 ns 01, 02, propagation delay time, 03, 04, 1.0 3.7 ns low to high level t plh 06 05 1.0 4.5 ns 01, 02, propagation delay time, 03, 04, 1.0 3.7 ns high to low level t phl 06 05 1.0 4.5 ns notes apply to device types 01-05 only. 1 / not applicable to "b" inputs of device types 01 and 05. 2 / applicable to "b" inputs only.
mil-m-38510/60b 6 3.6 electrical test requirements . the electrical test requirements fo r each device class shall be the subgroups specified in table ii. the electrical test s for each subgroup are described in table iii. table ii. electrical test requirements. subgroups (see table iii) mil-prf-38535 test requirements class s devices class b devices interim electrical parameters 1 1 final electrical test parameters 1*, 2, 3, 9 1*, 2, 3, 9 group a test requirements 1, 2, 3, 9, 10, 11 1, 2, 3, 9, 10, 11 group b electrical test parameters when using the method 5005 qci option 1, 2, 3 n/a group c end-point electrical parameters 1, 2, 3 1, 2, 3 group d end-point electrical parameters 1, 2, 3 1, 2, 3 *pda applies to subgroup 1. 3.7 marking. marking shall be in accordance with mil-prf-38535. 3.8 microcircuit group assignment. the devices covered by this specification shall be in microcircuit group number 8 see mil-prf-38535, appendix a). 4. verification 4.1 sampling and inspection. sampling and inspection procedures shall be in accordance with mil-prf- 38535 or as modified in the device manufacturer's qua lity management (qm) plan. the modification in the qm plan shall not effect the form, fi t, or function as described herein. 4.2 screening. screening shall be in accordance with mil-prf-38535 and shall be conducted on all devices prior to qualification and quality co nformance inspection. the following additional criteria shall apply: a. the burn-in test duration, test condition, and test temperature, or approved alternatives shall be as specified in the device manufacturer's qm plan in a ccordance with mil-prf-38535. the burn-in test circuit shall be maintained under document control by the device manufacturer's technology review board (trb) in accordance with mil-prf-38535 and shall be made available to the acquiring or preparing activity upon request. the test circuit shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the in tent specified in test me thod 1015 of mil-std-883. b. interim and final electrical test parameters shall be as specified in table ii, ex cept interim electrical parameters test prior to burn-in is optiona l at the discretion of the manufacturer.
mil-m-38510/60b 7 c. additional screening for space level produc t shall be as specified in mil-prf-38535. 4.3 qualification inspection. qualification inspection shall be in accordance with mil-prf-38535. 4.4 technology conformance inspection (tci). technology conformance inspection shall be in accordance with mil-prf-38535 and herein for groups a, b, c, and d inspections (see 4.4.1 through 4.4.4). 4.4.1 group a inspection. group a inspection shall be in accordan ce with table iii of mil-prf-38535 and as follows: a. tests shall be as spec ified in table ii herein. b. subgroups 4, 5, 6, 7, and 8 shall be omitted. 4.4.2 group b inspection. group b inspection shall be in accordance with table ii mil-prf-38535. 4.4.3 group c inspection. group c inspection shall be in accordance with table iv of mil-prf-38535 and as follows: a. end-point electrical parameters shall be as specified in table ii herein. b. the steady-state life test duration, test condition, and test temperat ure, or approved alternatives shall be as specified in the device manufacturer's qm plan in accordance with mil-prf-38535. the burn-in test circuit shall be maintained under document control by the device manufacturer's technology review board (trb) in accordance with mil-prf-38535 and shall be made available to the acquiring or preparing activity upon request. the test circui t shall specify the inputs, outputs, biases, and power dissipation, as applicable, in accordance with the in tent specified in test me thod 1005 of mil-std-883. 4.4.4 group d inspection. group d inspection shall be in accordance with table v of mil-prf-38535. end- point electrical parameters shall be as specified in table ii herein. 4.5 methods of inspection. methods of inspection shall be as specified and as follows: 4.5.1 voltage and current. all voltages given are referenced to the microcircuit ground terminal. currents given are conventional and positive when flowing into the referenced terminal. table iiia. test conditions for all devices, group a inspection symbol v ih1 (v) v il1 (v) v ih2 (v) v il2 (v) v itl (v) v ith (v) e 1 (v) e 2 (v) e 3 (v) ld 1 ld 2 in out t c = 25 c -0.780 -1.850 +1.11 +0.31 -1.475 -1.105 -5.2 -3.2 +2.0 100 ? to -2 v 100 ? to gnd see fig 3 t c = 125 c -0.630 -1.820 +1.24 +0.36 -1.400 -1.000 -5.2 -3.2 +2.0 100 ? to -2 v 100 ? to gnd see fig 3 t c = -55 c -0.880 -1.920 +1.01 +0.28 -1.510 -1.255 -5.2 -3.2 +2.0 100 ? to -2 v 100 ? to gnd see fig 3
mil-m-38510/60b 8 figure 1. terminal connections and logic diagrams .
mil-m-38510/60b 9 figure 1. terminal connections and logic diagrams - continued.
mil-m-38510/60b 10 figure 1. terminal connections and logic diagrams - continued.
mil-m-38510/60b 11 figure 1. terminal connections and logic diagrams - continued.
mil-m-38510/60b 12 figure 1. terminal connections and logic diagrams - continued.
mil-m-38510/60b 13 figure 1. terminal connections and logic diagrams - continued.
mil-m-38510/60b 14 device type 01 device type 02 truth table (each gate) truth table (each gate) inputs outputs inputs outputs a b y y a b y y l l l h l l l h h x h l h x h l x h h l x h h l h = high level h = high level l = low level l = low level x = irrelevent x = irrelevent positive logic: ? y output is applicable y = a + b for gate 4 only. y = b a + positive logic: y = a + b ? y = b a + device type 03 device type 04 truth table (each gate) truth table (each gate) inputs outputs inputs outputs a b c y y a b c d y l l l l h l l l l h h x x h l h x x x l x h x h l x h x x l x x h h l x x h x l x x x h l h = high level h = high level l = low level l = low level x = irrelevent x = irrelevent ? c input and last line are applicable ? d input and last line are applicable for gate 2 only for gate 2 only positive logic: y = a + b + c ? positive logic: y = d c b a + + + ? y = c b a + + ? device type 05 device type 06 truth table (each gate) truth table (each gate) inputs outputs inputs outputs a b y y a b c d e y y l l l h l l l l l l h h l h l h x x x x h l l h h l x h x x x h l h h l h x x h x x h l x x x h x h l x x x x h h l h = high level h = high level l = low level l = low level positive logic: x = irrelevent y = a b + a b ? e input and last line are y = a b + b a applicable for gate 2 only. positive logic: y = a + b + c + d + e ? y = e d c b a + + + + ? figure 2. truth tables .
mil-m-38510/60b 15 t c v ih2 10 mv v il2 10 mv 25 c +1.11 v +0.31 v 125 c +1.24 v +0.36 v -55 c +1.01 v +0.28 v t p = 40 ns 1 ns z out 50 ? t thl = 2.0 ns (20%-80%) 0.2 ns t tlh = 2.0 ns (20%-80%) 0.2 ns prr = 1.00 mhz 0.05 mhz notes: 1. perform test in accordance with test table; each output is tested separately. 2. all input and output cables are equal lengths of 50 ohm coaxial cables. wire length should be .250 (6.35 mm) from t p (in) to input pin and t p (out) to output pin. 3. outputs not under test connected to a 100 ohm resistor to ground. figure 3. switching time test circuit and waveforms .
mil-m-38510/60b 16 note: change in junction temperature versus forced air velocity, ref. to 500 linear ft./min. circuit power as variable parameter 100 ? load. figure 4. junction temperature versus air velocity case e . note: change in junction temperature versus forced air velocity, ref. to 500 linear ft./min. circuit power as variable parameter 100 ? load. figure 5. junction temperature versus air velocity case f .
mil-m-38510/60b 17 -55 c (mv/ c) +25 c (mv/ c) +125 c (mv/ c) parameter + ? t j - ? t j + ? t j - ? t j + ? t j - ? t j v oh max, v ih 1.38 1.38 1.40 1.38 1.40 1.40 v oh min, v oth 1.88 1.88 1.05 1.88 1.05 1.05 v ol max, v otl 0.44 0.44 0.75 0.44 0.75 0.75 v ol min, v il 0.88 0.88 0.30 0.88 0.30 0.30 v ith 1.88 1.88 1.05 1.88 1.05 1.05 v itl 0.44 0.44 0.75 0.44 0.75 0.75 figure 6. adjustment coefficients for forcing function and test limit compensation .
mil-m-38510/60b 18 note: ( j a ? vs ? forced air velocity) for case (e) and (f). t j = t c + j a x p d (max). figure 7. air velocity versus thermal resistance .
table iii. group a inspection for device type 01 . for terminal conditions see table iiia. terminal s not designated are open. case e 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 mil-std- case f 5 6 7 8 9 10 11 12 13 14 15 16 1 2 3 4 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 subgroup symbol 883 method case 2 measured terminal limits unit test no. v cc1 1 y 2 y 1a 1y 2y 2a v ee 4y 3a 3y b 4a 3 y 4 y v cc2 min max 1 v oh 3006 1 gnd ld 1 ld 1 ld 1 ld 1 e 1 ld 1 ld 1 v ih1 ld 1 ld 1 gnd 1y -0.93 -0.78 v tc = 25 c " 2 " " " " " " " " " " " " 2y " " " " 3 " " " " " " " " " " " " 3y " " " " 4 " " " " " " " " " " " " 4y " " " " 5 " " " " " " " " v il1 " " " 1 y " " " " 6 " " " " " " " " " " " " 2 y " " " " 7 " " " " " " " " " " " " 3 y " " " " 8 " " " " " " " " " " " " 4 y " " " " 9 " " " v il1 " " " " " " " " 1 y " " " " 10 " " " " " v il1 " " " " " " 2 y " " " " 11 " " " " " " " v il1 " " " " 3 y " " " " 12 " " " " " " " " v il1 " " " 4 y " " " " 13 " " " v ih1 " " " " " " " " 1y " " " " 14 " " " " " v ih1 " " " " " " 2y " " " " 15 " " " " " " " v ih1 " " " " 3y " " " " 16 " " " " " " " " v ih1 " " " 4y " " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -0.825 -0.63 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.08 -0.88 v v ol 3007 17 gnd ld 1 ld 1 ld 1 ld 1 e 1 ld 1 ld 1 v ih1 ld 1 ld 1 gnd 1 y -1.85 -1.62 v " 18 " " " " " " " " " " " " 2 y " " " " 19 " " " " " " " " " " " " 3 y " " " " 20 " " " " " " " " " " " " 4 y " " " " 21 " " " " " " " " v il1 " " " 1y " " " " 22 " " " " " " " " " " " " 2y " " " " 23 " " " " " " " " " " " " 3y " " " " 24 " " " " " " " " " " " " 4y " " " " 25 " " " v il1 " " " " " " " " 1y " " " " 26 " " " " " v il1 " " " " " " 2y " " " " 27 " " " " " " " v il1 " " " " 3y " " " " 28 " " " " " " " " v il1 " " " 4y " " " " 29 " " " v ih1 " " " " " " " " 1 y " " " " 30 " " " " " v ih1 " " " " " " 2 y " " " " 31 " " " " " " " v ih1 " " " " 3 y " " " " 32 " " " " " " " " v ih1 " " " 4 y " " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -1.82 -1.545 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.92 -1.655 v v oth 33 gnd ld 1 ld 1 ld 1 ld 1 e 1 ld 1 ld 1 v itl ld 1 ld 1 gnd 1 y -0.95 " 34 " " " " " " " " " " " " 2 y " " 35 " " " " " " " " " " " " 3 y " " 36 " " " " " " " " " " " " 4 y " " 37 " " " " " " " " v ith " " " 1y " " 38 " " " " " " " " " " " " 2y " " 39 " " " " " " " " " " " " 3y " " 40 " " " " " " " " " " " " 4y " " 41 " " " v itl " " " " " " " " 1 y " " 42 " " " " " v itl " " " " " " 2 y " " 43 " " " " " " " v itl " " " " 3 y " " 44 " " " " " " " " v itl " " " 4 y " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -.845 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.10 v 19 mil-m-38510/60b
table iii. group a inspection for device type 01 - continued. for terminal conditions see table iiia. terminal s not designated are open. case e 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 mil-std- case f 5 6 7 8 9 10 11 12 13 14 15 16 1 2 3 4 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 subgroup symbol 883 method case 2 measured terminal limits unit test no. v cc1 1 y 2 y 1a 1y 2y 2a v ee 4y 3a 3y b 4a 3 y 4 y v cc2 min max 1 v oth 45 gnd ld 1 ld 1 v ith ld 1 ld 1 e 1 ld 1 ld 1 ld 1 ld 1 gnd 1y -0.95 " tc = 25 c 46 " " " " " v ith " " " " " " 2y " " 47 " " " " " " " v ith " " " " 3y " " 48 " " " " " " " " v ith " " " 4y " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -.845 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.10 v 1 v otl 49 gnd ld 1 ld 1 ld 1 ld 1 e 1 ld 1 ld 1 v itl ld 1 ld 1 gnd 1y -1.60 v tc = 25 c 50 " " " " " " " " " " " " 2y " ? 51 " " " " " " " " " " " " 3y " " 52 " " " " " " " " " " " " 4y " " 53 " " " " " " " " v ith " " " 1 y " " 54 " " " " " " " " " " " " 2 y " " 55 " " " " " " " " " " " " 3 y " ? 56 " " " " " " " " " " " " 4 y " " 57 " " " v itl " " " " " " " " 1y " " 58 " " " " " v itl " " " " " " 2y " " 59 " " " " " " " v itl " " " " 3y " " 60 " " " " " " " " v itl " " " 4y " ? 61 " " " v ith " " " " " " " " 1 y " " 62 " " " " " v ith " " " " " " 2 y " " 63 " " " " " " " v ith " " " " 3 y " " 64 " " " " " " " " v ith " " " 4 y " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -1.525 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.635 v 1 tc = 25 c i ee 3005 65 gnd e 1 gnd v ee -26 ma 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -29 ma 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -29 ma 1 i ih1 3010 66 gnd v ih1 e 1 gnd 1a 265 a tc = 25 c " 67 " v ih1 " " 2a " " " 68 " " v ih1 " 3a " ? " 69 " " v ih1 " 4a " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. 450 a 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. 450 a 1 tc = 25 c i ih2 3010 70 gnd e 1 v ih1 b 550 a 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. 935 a 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. 935 a 1 i iil 3009 71 gnd v il1 e 1 gnd 1a 0.5 a tc = 25 c " 72 " v il1 " " 2a " " 73 " " v il1 " 3a " " 74 " " v il1 " 4a " " 75 " " v il1 " b " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. 0.3 a 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. 0.5 a 9 t tlh 3004 76 e 3 ld 2 ld 2 in out ld 2 e 2 ld 2 ld 2 ld 2 ld 2 e 3 1y 1.1 3.3 ns tc = 25 c " 77 " out " in ld 2 " " " " " " " 1 y " " " " 78 " ld 2 " " out in " " " " " " 2y " " " " 79 " " out " ld 2 in " " " " " " 2 y " " " " 80 " " ld 2 " " " " in out " " " 3y " " " " 81 " " " " " " " in ld 2 out " " 3 y " " " " 82 " " " " " " out " in ld 2 " " 4y " " " " 83 " " " " " " ld 2 " in " out " 4 y " " " 10 same tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 4.0 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 4.0 ns mil-m-38510/60b 20
table iii. group a inspection for device type 01 - continued. for terminal conditions see table iiia. terminal s not designated are open. case e 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 mil-std- case f 5 6 7 8 9 10 11 12 13 14 15 16 1 2 3 4 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 subgroup symbol 883 method case 2 measured terminal limits unit test no. v cc1 1 y 2 y 1a 1y 2y 2a v ee 4y 3a 3y b 4a 3 y 4 y v cc2 min max 9 t thl 3004 84 e 3 ld 2 ld 2 in out ld 2 e 2 ld 2 ld 2 ld 2 ld 2 e 3 1y 1.1 3.3 ns tc = 25 c " 85 " out " in ld 2 " " " " " " " 1 y " " " " 86 " ld 2 " " out in " " " " " " 2y " " " " 87 " " out " ld 2 in " " " " " " 2 y " " " " 88 " " ld 2 " " " " in out " " " 3y " " " " 89 " " " " " " " in ld 2 out " " 3 y " " " " 90 " " " " " " out " in ld 2 " " 4y " " " " 91 " " " " " " ld 2 " in " out " 4 y " " " 10 same tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 4.0 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 4.0 ns 9 t plh 3003 92 e 3 ld 2 ld 2 in out ld 2 e 2 ld 2 ld 2 ld 2 ld 2 e 3 1y 1.0 2.9 ns tc = 25 c " 93 " out " in ld 2 " " " " " " " 1 y " " " " 94 " ld 2 " " out in " " " " " " 2y " " " " 95 " " out " ld 2 in " " " " " " 2 y " " " " 96 " " ld 2 " " " " in out " " " 3y " " " " 97 " " " " " " " in ld 2 out " " 3 y " " " " 98 " " " " " " out " in ld 2 " " 4y " " " " 99 " " " " " " ld 2 " in " out " 4 y " " " 10 same tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 3.7 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 3.7 ns 9 t phl 3003 100 e 3 ld 2 ld 2 in out ld 2 e 2 ld 2 ld 2 ld 2 ld 2 e 3 1y 1.0 2.9 ns tc = 25 c " 101 " out " in ld 2 " " " " " " " 1 y " " " " 102 " ld 2 " " out in " " " " " " 2y " " " " 103 " " out " ld 2 in " " " " " " 2 y " " " " 104 " " ld 2 " " " " in out " " " 3y " " " " 105 " " " " " " " in ld 2 out " " 3 y " " " " 106 " " " " " " out " in ld 2 " " 4y " " " " 107 " " " " " " ld 2 " in " out " 4 y " " " 10 same tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 3.7 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 3.7 ns 21 mil-m-38510/60b
table iii. group a inspection for device type 02 . for terminal conditions see table iiia. terminal s not designated are open. case e 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 mil-std- case f 5 6 7 8 9 10 11 12 13 14 15 16 1 2 3 4 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 subgroup symbol 883 method case 2 measured terminal limits unit test no. v cc1 1 y 2 y 1a 1b 2a 2b v ee 4y 3a 3b 4a 4b 3 y 4 y v cc2 min max 1 v oh 3006 1 gnd ld 1 ld 1 v il1 e 1 ld 1 ld 1 ld 1 gnd 1 y 0.930 -0.780 v tc = 25 c " 2 " " " v il1 " " " " " " 2 y " " " " 3 " " " " " " v il1 " " " 3 y " " " " 4 " " " " " " v il1 " " " 4 y " " " " 5 " " " " " " v ih1 " " " 4y " " " " 6 " " " v il1 " " " " " " 1 y " " " " 7 " " " v il1 " " " " " 2 y " " " " 8 " " " " " " v il1 " " " 3 y " " " " 9 " " " " " " v il1 " " " 4 y " " " " 10 " " " " " " v ih1 " " " 4y " " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -0.825 -0.630 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.080 -0.880 v 1 v ol 3007 11 gnd ld 1 ld 1 e 1 ld 1 v il1 ld 1 ld 1 gnd 4y -.1.850 -1.620 v tc = 25 c " 12 " " " v ih1 " " " " " 1 y " " " " 13 " " " v ih1 " " " " " " 2 y " " " " 14 " " " " " " v ih1 " " " 3 y " " " " 15 " " " " " " v ih1 " " " 4 y " " " " 16 " " " " " " v il1 " " " 4y " " " " 17 " " " v ih1 " " " " " " 1 y " " " " 18 " " " v ih1 " " " " " 2 y " " " " 19 " " " " " v ih1 " " " 3 y " " " " 20 " " " " " v ih1 " " " 4 y " " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -1.820 -1.545 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.920 -1.655 v v oth 21 gnd ld 1 ld 1 v itl e 1 ld 1 ld 1 ld 1 gnd 1 y -0.950 v 22 " " " v itl " " " " " " 2 y " " 23 " " " " " " v itl " " " 3 y " " 24 " " " " " " v itl " " " 4 y " " 25 " " " " " " v ith " " " 4y " " 26 " " " v itl " " " " " " 1 y " " 27 " " " v itl " " " " " 2 y " " 28 " " " " " " v itl " " " 3 y " " 29 " " " " " " v itl " " " 4 y " " 30 " " " " " " v ith " " " 4y " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -0.845 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.100 v v otl 31 gnd ld 1 ld 1 e 1 ld 1 v itl ld 1 ld 1 gnd 4y -1.600 v 32 " " " v ith " " " " " 1 y " " 33 " " " v ith " " " " " " 2 y " " 34 " " " " " " v ith " " " 3 y " " 35 " " " " " " v ith " " " 4 y " " 36 " " " " " " v itl " " " 4y " " 37 " " " v ith " " " " " " 1 y " " 38 " " " v ith " " " " " 2 y " " 39 " " " " " v ith " " " 3 y " " 40 " " " " " v ith " " " 4 y " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -1.525 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.635 v 22 mil-m-38510/60b
table iii. group a inspection for device type 02 - continued. for terminal conditions see table iiia. terminal s not designated are open. case e 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 mil-std- case f 5 6 7 8 9 10 11 12 13 14 15 16 1 2 3 4 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 subgroup symbol 883 method case 2 measured terminal limits unit test no. v cc1 1 y 2 y 1a 1b 2a 2b v ee 4y 3a 3b 4a 4b 3 y 4 y v cc2 min max 1 tc = 25 c i ee 41 gnd e 1 gnd v ee -26 ma 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -29 ma 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -29 ma 1 i ih1 42 gnd v ih1 e 1 gnd 1a 265 a tc = 25 c 43 " v ih1 " " 1b " " 44 " v ih1 " " 2a " ? 45 " v ih1 " " 2b " " 46 " " v ih1 " 3a " " 47 " " v ih1 " 3b " " 48 " " v ih1 " 4a " " 49 " " v ih1 " 4b " ? 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. 450 a 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. 450 a 1 i il 50 gnd v il1 " " 1a 0.5 a tc = 25 c 51 " v il1 " " 1b " " 52 " v il1 " " 2a " ? 53 " v il1 " " 2b " " 54 " " v il1 " 3a " " 55 " " v il1 " 3b " " 56 " " v il1 " 4a " " 57 " " v il1 " 4b " ? 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. 0.3 a 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. 0.5 a 9 t tlh 3004 58 e 3 out ld 2 in e 2 ld 2 ld 2 ld 2 e 3 1 y 1.1 3.3 ns tc = 25 c " 59 " ld 2 out in " " " " " 2 y " " " " 60 " " ld 2 " " in out " " 3 y " " ? " 61 " " " " " in ld 2 out " 4 y " " " " 62 " " " " out in " ld 2 " 4y " " " 10 same tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 4.0 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 4.0 ns 9 t thl 3004 63 e 3 out ld 2 in e 2 ld 2 ld 2 ld 2 e 3 1 y 1.1 3.3 ns tc = 25 c " 64 " ld 2 out in " " " " " 2 y " " " " 65 " " ld 2 " " in out " " 3 y " " " " 66 " " " " " in ld 2 out " 4 y " " " " 67 " " " " out in " ld 2 " 4y " " " 10 same tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 4.0 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 4.0 ns 9 t plh 3003 68 e 3 out ld 2 in e 2 ld 2 ld 2 ld 2 e 3 1 y 1.0 2.9 ns tc = 25 c " 69 " ld 2 out in " " " " " 2 y " " " " 70 " " ld 2 " " in out " " 3 y " " " " 71 " " " " " in ld 2 out " 4 y " " " " 72 " " " " out in " ld 2 " 4y " " " 10 same tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 3.7 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 3.7 ns 9 t phl 3003 73 e 3 out ld 2 in e 2 ld 2 ld 2 ld 2 e 3 1 y 1.0 2.9 ns tc = 25 c " 74 " ld 2 out in " " " " " 2 y " " " " 75 " " ld 2 " " in out " " 3 y " " " " 76 " " " " " in ld 2 out " 4 y " " " " 77 " " " " out in " ld 2 " 4y " " " 10 same tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 3.7 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 3.7 ns mil-m-38510/60b 23
table iii. group a inspection for device type 03 . for terminal conditions see table iiia. terminal s not designated are open. case e 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 mil-std- case f 5 6 7 8 9 10 11 12 13 14 15 16 1 2 3 4 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 subgroup symbol 883 method case 2 measured terminal limits unit test no. v cc1 1y 1 y 1a 1b 2 y 2y v ee 2a 2b 2c 3a 3b 3 y 3y v cc2 min max 1 v oh 3006 1 gnd ld 1 ld 1 v ih1 ld 1 ld 1 e 1 ld 1 ld 1 gnd 1y -0.930 -0.780 v tc = 25 c " 2 " " " v ih1 " " " " " " 1y " " " " 3 " " " v il1 " " " " " " 1 y " " " " 4 " " " v il1 " " " " " " 1 y " " " " 5 " " " " " " v il1 " " " 2 y " " " " 6 " " " " " " v il1 " " " 2 y " " " " 7 " " " " " " v il1 " " " 2 y " " " " 8 " " " " " " v ih1 " " " 2y " " " " 9 " " " " " " v ih1 " " " 2y " " " " 10 " " " " " " v ih1 " " " 2y " " " " 11 " " " " " " v il1 " " " 3 y " " " " 12 " " " " " " v il1 " " " 3 y " " " " 13 " " " " " " v ih1 " " " 3y " " " " 14 " " " " " " v ih1 " " " 3y " " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -0.825 -0.630 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.080 -0.880 v 1 v ol 3007 15 gnd ld 1 ld 1 v il1 ld 1 ld 1 e 1 ld 1 ld 1 gnd 1y -1.850 -1.620 v tc = 25 c " 16 " " " v il1 " " " " " " 1y " " " " 17 " " " v ih1 " " " " " " 1 y " " " " 18 " " " v ih1 " " " " " " 1 y " " " " 19 " " " " " " v ih1 " " " 2 y " " " " 20 " " " " " " v ih1 " " " 2 y " " " " 21 " " " " " " v ih1 " " " 2 y " " " " 22 " " " " " " v il1 " " " 2y " " " " 23 " " " " " " v il1 " " " 2y " " " " 24 " " " " " " v il1 " " " 2y " " " " 25 " " " " " " v ih1 " " " 3 y " " " " 26 " " " " " " v ih1 " " " 3 y " " " " 27 " " " " " " v il1 " " " 3y " " " " 28 " " " " " " v il1 " " " 3y " " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -1.820 -1.545 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.920 -1.655 v 1 v oth 29 gnd ld 1 ld 1 v ith ld 1 ld 1 e 1 ld 1 ld 1 gnd 1y -0.950 v tc = 25 c 30 " " " v ith " " " " " " 1y " " 31 " " " v itl " " " " " " 1 y " " 32 " " " v itl " " " " " " 1 y " " 33 " " " " " " v itl " " " 2 y " " 34 " " " " " " v itl " " " 2 y " " 35 " " " " " " v itl " " " 2 y " " 36 " " " " " " v ith " " " 2y " " 37 " " " " " " v ith " " " 2y " " 38 " " " " " " v ith " " " 2y " " 39 " " " " " " v itl " " " 3 y " " 40 " " " " " " v itl " " " 3 y " " 41 " " " " " " v ith " " " 3y " " 42 " " " " " " v ith " " " 3y " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -0.850 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.100 v mil-m-38510/60b 24
table iii. group a inspection for device type 03 - continued. for terminal conditions see table iiia. terminal s not designated are open. case e 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 mil-std- case f 5 6 7 8 9 10 11 12 13 14 15 16 1 2 3 4 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 subgroup symbol 883 method case 2 measured terminal limits unit test no. v cc1 1y 1 y 1a 1b 2 y 2y v ee 2a 2b 2c 3a 3b 3 y 3y v cc2 min max 1 v otl 43 gnd ld 1 ld 1 v itl ld 1 ld 1 e 1 ld 1 ld 1 gnd 1y -1.600 v tc = 25 c 44 " " " v itl " " " " " " 1y " " 45 " " " v ith " " " " " " 1 y " " 46 " " " v ith " " " " " " 1 y " " 47 " " " " " " v ith " " " 2 y " " 48 " " " " " " v ith " " " 2 y " " 49 " " " " " " v ith " " " 2 y " " 50 " " " " " " v itl " " " 2y " " 51 " " " " " " v itl " " " 2y " " 52 " " " " " " v itl " " " 2y " " 53 " " " " " " v ith " " " 3 y " " 54 " " " " " " v ith " " " 3 y " " 55 " " " " " " v itl " " " 3y " " 56 " " " " " " v itl " " " 3y " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -1.525 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.635 v 1 tc = 25 c i ee 3005 57 gnd e 1 gnd v ee -21 ma 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -24 ma 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -24 ma 1 i ih1 3010 58 gnd e 1 v ih gnd 3b 265 a tc = 25 c " 59 " " v ih " 3a " " " 60 " v ih1 " " 1a " " " 61 " v ih1 " " 1b " " " 62 " " v ih1 " 2a " " " 63 " " v ih1 " 2b " " " 64 " " v ih1 " 2c " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. 450 a 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. 450 a 1 i il 3009 65 gnd e 1 v il gnd 3b 0.5 a tc = 25 c " 66 " " v il " 3a " " " 67 " v il1 " " 1a " " " 68 " v il1 " " 1b " " " 69 " " v il1 " 2a " " " 70 " " v il1 " 2b " " " 71 " " v il1 " 2c " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. 0.3 a 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. 0.5 a mil-m-38510/060b mil-m-38510/060b mil-m-38510/060b mil-m-38510/060b mil-m-38510/060b mil-m-38510/060b 25
table iii. group a inspection for device type 03 - continued. for terminal conditions see table iiia. terminal s not designated are open. case e 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 mil-std- case f 5 6 7 8 9 10 11 12 13 14 15 16 1 2 3 4 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 subgroup symbol 883 method case 2 measured terminal limits unit test no. v cc1 1y 1 y 1a 1b 2 y 2y v ee 2a 2b 2c 3a 3b 3 y 3y v cc2 min max 9 t tlh 3004 72 e 3 out ld 2 in ld 2 ld 2 e 2 ld 2 ld 2 e 3 1y 1.1 3.3 ns tc = 25 c " 73 " ld 2 out in " " " " " " 1 y " " " " 74 " " ld 2 " out " in " " " 2y " " " " 75 " " " out ld 2 " in " " " 2 y " " " " 76 " " " ld 2 " " in " out " 3y " " " " 77 " " " " " " in out ld 2 " 3 y " " " 10 same tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 4.0 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 4.0 ns 9 t thl 3004 78 e 3 out ld 2 in ld 2 ld 2 e 2 ld 2 ld 2 e 3 1y 1.1 3.3 ns tc = 25 c " 79 " ld 2 out in " " " " " " 1 y " " " " 80 " " ld 2 " out " in " " " 2y " " " " 81 " " " out ld 2 " in " " " 2 y " " " " 82 " " " ld 2 " " in " out " 3y " " " " 83 " " " " " " in out ld 2 " 3 y " " " 10 same tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 4.0 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 4.0 ns 9 t plh 3003 84 e 3 out ld 2 in ld 2 ld 2 e 2 ld 2 ld 2 e 3 1y 1.0 2.9 ns tc = 25 c " 85 " ld 2 out in " " " " " " 1 y " " " " 86 " " ld 2 " out " in " " " 2y " " " " 87 " " " out ld 2 " in " " " 2 y " " " " 88 " " " ld 2 " " in " out " 3y " " " " 89 " " " " " " in out ld 2 " 3 y " " " 10 s ame tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 3.7 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 3.7 ns 9 t phl 3003 90 e 3 out ld 2 in ld 2 ld 2 e 2 ld 2 ld 2 e 3 1y 1.0 2.9 ns tc = 25 c " 91 " ld 2 out in " " " " " " 1 y " " " " 92 " " ld 2 " out " in " " " 2y " " " " 93 " " " out ld 2 " in " " " 2 y " " " " 94 " " " ld 2 " " in " out " 3y " " " " 95 " " " " " " in out ld 2 " 3 y " " " 10 same tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 3.7 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 3.7 ns 26 mil-m-38510/60b
table iii. group a inspection for device type 04 . for terminal conditions see table iiia. terminal s not designated are open. case e 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 mil-std- case f 5 6 7 8 9 10 11 12 13 14 15 16 1 2 3 4 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 subgroup symbol 883 method case 2 measured terminal limits unit test no. v cc1 1 y 2 y 2a 2b 2c 2d v ee 1a 1b 1c 3a 3b 3c 3 y v cc2 min max 1 v oh 3006 1 gnd ld 1 ld 1 e 1 v il1 ld 1 gnd 3 y -1.930 -0.780 v tc = 25 c " 2 " " " " v il1 " " 3 y " " " " 3 " " " " v il1 " " 3 y " " " " 4 " " " " v il1 " " 1 y " " " " 5 " " " " v il1 " " 1 y " " " " 6 " " " " v il1 " " 1 y " " " " 7 " " " v il1 " " " 2 y " " " " 8 " " " v il1 " " " 2 y " " " " 9 " " " v il1 " " " 2 y " " " " 10 " " " v il1 " " " 2 y " " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -0.825 -0.630 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.080 -0.880 v 1 v ol 3007 11 gnd ld 1 ld 1 e 1 v ih1 ld 1 gnd 3 y -1.850 -1.620 v tc = 25 c " 12 " " " " v ih1 " " 3 y " " " " 13 " " " " v ih1 " " 3 y " " " " 14 " " " " v ih1 " " 1 y " " " " 15 " " " " v ih1 " " 1 y " " " " 16 " " " " v ih1 " " 1 y " " " " 17 " " " v ih1 " " " 2 y " " " " 18 " " " v ih1 " " " 2 y " " " " 19 " " " v ih1 " " " 2 y " " " " 20 " " " v ih1 " " " 2 y " " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -1.820 -1.545 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.920 -1.655 v 1 v oth 21 gnd ld 1 ld 1 e 1 v itl ld 1 " 3 y -0.950 v tc = 25 c 22 " " " " v itl " " 3 y " " 23 " " " " v itl " " 3 y " " 24 " " " " v itl " " 1 y " " 25 " " " " v itl " " 1 y " " 26 " " " " v itl " " 1 y " " 27 " " " v itl " " " 2 y " " 28 " " " v itl " " " 2 y " " 29 " " " v itl " " " 2 y " " 30 " " " v itl " " " 2 y " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -0.845 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.100 v 1 v otl 31 gnd ld 1 ld 1 e 1 v ith ld 1 gnd 3 y -1.600 v tc = 25 c 32 " " " " v ith " " 3 y " " 33 " " " " v ith " " 3 y " " 34 " " " " v ith " " 1 y " " 35 " " " " v ith " " 1 y " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -1.525 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.635 v 27 mil-m-38510/60b
table iii. group a inspection for device type 04 - continued. for terminal conditions see table iiia. terminal s not designated are open. case e 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 mil-std- case f 5 6 7 8 9 10 11 12 13 14 15 16 1 2 3 4 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 subgroup symbol 883 method case 2 measured terminal limits unit test no. v cc1 1 y 2 y 2a 2b 2c 2d v ee 1a 1b 1c 3a 3b 3c 3 y v cc2 min max 1 v otl 36 gnd ld 1 ld 1 e 1 v ith ld 1 gnd 1 y -1.600 v tc = 25 c 37 " " " v ith " " " 2 y " " 38 " " " v ith " " " 2 y " " 39 " " " v ith " " " 2 y " " 40 " " " v ith " " " 2 y " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -1.525 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.635 v 1 tc = 25 c i ee 3005 41 gnd e 1 gnd v ee -21 ma 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -24 ma 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -24 ma 1 i ih1 3010 42 gnd e 1 v ih1 gnd 3a 265 a tc = 25 c " 43 " " v ih1 " 3b " " " 44 " " v ih1 " 3c " " " 45 " " v ih1 " 1a " " " 46 " " v ih1 " 1b " " " 47 " " v ih1 " 1c " " " 48 " v ih1 " " 2a " " " 49 " v ih1 " " 2b " " " 50 " v ih1 " " 2c " " " 51 " v ih1 " " 2d " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. 450 a 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. 450 a 1 i il 3009 52 gnd e 1 v il1 gnd 3a 0.5 a tc = 25 c " 53 " " v il1 " 3b " " " 54 " " v il1 " 3c " " " 55 " " v il1 " 1a " " " 56 " " v il1 " 1b " " " 57 " " v il1 " 1c " " " 58 " v il1 " " 2a " " " 59 " v il1 " " 2b " " " 60 " v il1 " " 2c " " " 61 " v il1 " " 2d " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. 0.3 a 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. 0.5 a 28 mil-m-38510/60b
table iii. group a inspection for device type 04 - continued. for terminal conditions see table iiia. terminal s not designated are open. case e 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 mil-std- case f 5 6 7 8 9 10 11 12 13 14 15 16 1 2 3 4 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 subgroup symbol 883 method case 2 measured terminal limits unit test no. v cc1 1 y 2 y 2a 2b 2c 2d v ee 1a 1b 1c 3a 3b 3c 3 y v cc2 min max 9 t tlh 3004 62 e 3 ld 2 out in e 2 ld 2 e 3 2 y 1.1 3.3 ns tc = 25 c " 63 " out ld 2 " in " " 1 y " " " " 64 " ld 2 " in out " 3 y " " " 10 same tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 4.0 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 4.0 ns 9 t thl 3004 65 e 3 out in e 2 ld 2 e 3 2 y 1.1 3.3 ns tc = 25 c " 66 " out ld 2 " in " " 1 y " " " " 67 " ld 2 " in out " 3 y " " " 10 same tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 4.0 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 4.0 ns 9 t plh 3003 68 e 3 out in e 2 ld 2 e 3 2 y 1.0 2.9 ns tc = 25 c 69 " out ld 2 " in " " 1 y " " " 70 " ld 2 ld 2 " in out " 3 y " " " 10 s ame tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 3.7 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 3.7 ns 9 t phl 3003 71 e 3 ld 2 out in e 2 ld 2 e 3 2 y 1.0 2.9 ns tc = 25 c 72 " out ld 2 " in " " 1 y " " " 73 " ld 2 ld 2 " in out " 3 y " " " 10 s ame tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 3.7 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 3.7 ns 29 mil-m-38510/60b
table iii. group a inspection for device type 05 . for terminal conditions see table iiia. terminal s not designated are open. case e 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 mil-std- case f 5 6 7 8 9 10 11 12 13 14 15 16 1 2 3 4 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 subgroup symbol 883 method case 2 measured terminal limits unit test no. v cc1 1 y 1y 1a 1b 2b v ee 2a 2y 2 y 3 y 3y 3a 3b v cc2 min max 1 v oh 3006 1 gnd ld 1 ld 1 e 1 ld 1 ld 1 ld 1 ld 1 v ih1 gnd 3y -0.930 -0.780 v tc = 25 c " 2 " " " " " " " " v ih1 " 3y " " " " 3 " " " v ih1 " " " " " " 1y " " " " 4 " " " v ih1 " " " " " " 1y " " " " 5 " " " " v ih1 " " " " " 2y " " " " 6 " " " v ih1 " " " " " " 2y " " " " 7 " " " " " " " " v il1 " 3 y " " " " 8 " " " " " " " " v il1 " 3 y " " " " 9 " " " v il1 " " " " " " 1 y " " " " 10 " " " v il1 " " " " " " 1 y " " " " 11 " " " " v il1 " " " " " 2 y " " " " 12 " " " v il1 " " " " " " 2 y " " " " 13 " " " " " " " " v il1 v il1 " 3 y " " " " 14 " " " v il1 v il1 " " " " " " 1 y " " " " 15 " " " v il1 " v il1 " " " " " 2 y " " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -0.825 -0.630 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.080 -0.880 v 1 v ol 3007 16 gnd ld 1 ld 1 e 1 ld 1 ld 1 ld 1 ld 1 v ih1 gnd 3 y -1.850 -1.620 v tc = 25 c " 17 " " " " " " " " v ih1 " 3 y " " " " 18 " " " v ih1 " " " " " " 1 y " " " " 19 " " " v ih1 " " " " " " 1 y " " " " 20 " " " " v ih1 " " " " " 2 y " " " " 21 " " " v ih1 " " " " " " 2 y " " " " 22 " " " " " " " " v il1 " 3y " " " " 23 " " " " " " " " v il1 " 3y " " " " 24 " " " v il1 " " " " " " 1y " " " " 25 " " " v il1 " " " " " " 1y " " " " 26 " " " " v il1 " " " " " 2y " " " " 27 " " " v il1 " " " " " " 2y " " " " 28 " " " " " " " " v ih1 v ih1 " 3y " " " " 29 " " " v ih1 v ih1 " " " " " " 1y " " " " 30 " " " v ih1 " v ih1 " " " " " 2y " " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -1.820 -1.545 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.920 -1.655 v 1 v oth 31 gnd ld 1 ld 1 e 1 ld 1 ld 1 ld 1 ld 1 v ith gnd 3y -0.950 v tc = 25 c 32 " " " " " " " " v ith " 3y " " 33 " " " v ith " " " " " " 1y " " 34 " " " v ith " " " " " " 1y " " 35 " " " " v ith " " " " " 2y " " 36 " " " v ith " " " " " " 2y " " 37 " " " " " " " " v itl " 3 y " " 38 " " " " " " " " v itl " 3 y " " 39 " " " v itl " " " " " " 1 y " " 40 " " " v itl " " " " " " 1 y " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -0.845 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.100 v 30 mil-m-38510/60b
table iii. group a inspection for device type 05 - continued. for terminal conditions see table iiia. terminal s not designated are open. case e 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 mil-std- case f 5 6 7 8 9 10 11 12 13 14 15 16 1 2 3 4 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 subgroup symbol 883 method case 2 measured terminal limits unit test no. v cc1 1 y 1y 1a 1b 2b v ee 2a 2y 2 y 3 y 3y 3a 3b v cc2 min max 1 v oth 41 gnd ld 1 ld 1 e 1 v itl ld 1 ld 1 ld 1 ld 1 gnd 2 y -0.950 v tc = 25 c 42 " " " v itl " " " " " " 2 y " " 43 " " " " " " " " v itl v itl " 3 y " " 44 " " " v itl v itl " " " " " " 1 y " " 45 " " " v itl " v itl " " " " " 2 y " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -0.845 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.100 v 1 v otl 46 gnd ld 1 ld 1 e 1 ld 1 ld 1 ld 1 ld 1 v ith gnd 3 y -1.600 v tc = 25 c 47 " " " " " " " " v ith " 3 y " " 48 " " " v ith " " " " " " 1 y " " 49 " " " v ith " " " " " " 1 y " " 50 " " " " v ith " " " " " 2 y " " 51 " " " v ith " " " " " " 2 y " " 52 " " " " " " " " v itl " 3y " " 53 " " " " " " " " v itl " 3y " " 54 " " " v itl " " " " " " 1y " " 55 " " " v itl " " " " " " 1y " " 56 " " " " v itl " " " " " 2y " " 57 " " " v itl " " " " " " 2y " " 58 " " " " " " " " v ith v ith " 3y " " 59 " " " v ith v ith " " " " " " 1y " " 60 " " " v ith " v ith " " " " " 2y " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -1.525 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.635 v 1 tc = 25 c i ee 3005 61 gnd v ih1 v ih1 e 1 v ih1 gnd v ee -28 ma same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -31 ma 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -31 ma 1 i ih1 3010 62 gnd v ih1 e 1 gnd 1a 265 a tc = 25 c 63 " " v ih1 " 2a " " 64 " " v ih1 " 3a " " 65 " v ih1 v ih1 " " 1a " " 66 " v ih1 " v ih1 " 2a " " 67 " " v ih1 v ih1 " 3a " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. 450 a 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. 450 a 1 i ih2 3010 68 gnd v ih1 e 1 gnd 1b 220 a tc = 25 c 69 " v ih1 " " 2b " " 70 " " v ih1 " 3b " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. 375 a 3 same t ests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. 375 a 1 i il 3009 71 gnd v il1 e 1 gnd 1a 0.5 a tc = 25 c " 72 " v il1 " " 1b " " " 73 " v il1 " " 2b " " " 74 " " v il1 " 2a " " " 75 " " v il1 " 3a " " " 76 " " v il1 " 3b " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. 0.3 a 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. 0.5 a mil-m-38510/60b 31
table iii. group a inspection for device type 05 - continued. for terminal conditions see table iiia. terminal s not designated are open. case e 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 mil-std- case f 5 6 7 8 9 10 11 12 13 14 15 16 1 2 3 4 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 subgroup symbol 883 method case 2 measured terminal limits unit test no. v cc1 1 y 1y 1a 1b 2b v ee 2a 2y 2 y 3 y 3y 3a 3b v cc2 min max 9 t tlh 3004 77 e 3 ld 2 out in v il2 e 2 ld 2 ld 2 ld 2 ld 2 e 3 1y 1.1 3.5 ns tc = 25 c " 78 " out ld 2 in v il2 " " " " " " 1 y " " " " 79 " ld 2 " in " v il2 out " " " " 2y " " " " 80 " " " in " v il2 ld 2 out " " " 2 y " " " " 81 " " " " " ld 2 " out in v il2 " 3y " " " " 82 " " " " " " out ld 2 in v il2 " 3 y " " ? 10 same tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 4.3 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 4.3 ns 9 t thl 3004 83 " ld 2 out v il2 in e 2 ld 2 ld 2 ld 2 ld 2 " 1y 1.1 3.5 ns tc = 25 c " 84 " out ld 2 v il2 in " " " " " " 1 y " " " " 85 " ld 2 " v il2 " in out " " " " 2y " " " " 86 " " " v il2 " in ld 2 out " " " 2 y " " " " 87 " " " " " ld 2 " out v il2 in " 3y " " " " 88 " " " " " " out ld 2 v il2 in " 3 y " " " 10 same tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 4.3 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 4.3 ns 9 t plh 3003 89 e 3 ld 2 out in v il2 e 2 ld 2 ld 2 ld 2 ld 2 e 3 1y 1.1 3.7 ns tc = 25 c " 90 " " " in v ih2 " " " " " " 1y " " " " 91 " " " v ih2 in " " " " " " 1y " " " " 92 " " " v il2 " " " " " " " 1y " " " " 93 " out ld 2 v ih2 " " " " " " " 1 y " " " " 94 " " " v il2 " " " " " " " 1 y " " " " 95 " " " in v il2 " " " " " " 1 y " " " " 96 " " " in v ih2 " " " " " " 1 y " " " " 97 " ld 2 " in " v il2 out " " " " 2y " " " " 98 " " " in " v ih2 " " " " " 2y " " " " 99 " " " v ih2 " in " " " " " 2y " " " " 100 " " " v il2 " " " " " " " 2y " " " " 101 " " " v ih2 " " ld 2 out " " " 2 y " " " " 102 " " " v il2 " " " " " " " 2 y " " " " 103 " " " in " v il2 " " " " " 2 y " " " " 104 " " " in " v ih2 " " " " " 2 y " " " " 105 " " " " " ld 2 " out in v il2 " 3y " " " " 106 " " " " " " " " in v ih2 " 3y " " " " 107 " " " " " " " " v ih2 in " 3y " " " " 108 " " " " " " " " v il2 " " 3y " " " " 109 " " " " " " out ld 2 v il2 " " 3 y " " " " 110 " " " " " " " " v ih2 " " 3 y " " " " 111 " " " " " " " " in v ih2 " 3 y " " " " 112 " " " " " " " " in v il2 " 3 y " " " 10 same tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 4.5 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 4.5 ns 32 mil-m-38510/60b
table iii. group a inspection for device type 05 - continued. for terminal conditions see table iiia. terminal s not designated are open. case e 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 mil-std- case f 5 6 7 8 9 10 11 12 13 14 15 16 1 2 3 4 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 subgroup symbol 883 method case 2 measured terminal limits unit test no. v cc1 1 y 1y 1a 1b 2b v ee 2a 2y 2 y 3 y 3y 3a 3b v cc2 min max 9 t phl 3003 113 e 3 ld 2 out in v ih2 e 2 ld 2 ld 2 ld 2 ld 2 e 3 1y 1.1 3.7 ns tc = 25 c " 114 " " " in v il2 " " " " " " 1y " " " " 115 " " " v il2 in " " " " " " 1y " " " " 116 " " " v ih2 " " " " " " " 1y " " " " 117 " out ld 2 v il2 " " " " " " " 1 y " " " " 118 " " " v ih2 " " " " " " " 1 y " " " " 119 " " " in v ih2 " " " " " " 1 y " " " " 120 " " " in v il2 " " " " " " 1 y " " " " 121 " ld 2 " in " v ih2 out " " " " 2y " " " " 122 " " " in " v il2 " " " " " 2y " " " " 123 " " " v il2 " in " " " " " 2y " " " " 124 " " " v ih2 " " " " " " " 2y " " " " 125 " " " v il2 " " ld 2 out " " " 2 y " " " " 126 " " " v ih2 " " " " " " " 2 y " " " " 127 " " " in " v ih2 " " " " " 2 y " " " " 128 " " " in " v il2 " " " " " 2 y " " " " 129 " " " " " ld 2 " out in v il2 " 3y " " " " 130 " " " " " " " " in v ih2 " 3y " " " " 131 " " " " " " " " v il2 in " 3y " " " " 132 " " " " " " " " v ih2 " " 3y " " " " 133 " " " " " " out ld 2 v il2 " " 3 y " " " " 134 " " " " " " " " v ih2 " " 3 y " " " " 135 " " " " " " " " in v ih2 " 3 y " " " " 136 " " " " " " " " in v il2 " 3 y " " " 10 same tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 4.5 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 4.5 ns 33 mil-m-38510/60b
table iii. group a inspection for device type 06 . for terminal conditions see table iiia. terminal s not designated are open. case e 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 mil-std- case f 5 6 7 8 9 10 11 12 13 14 15 16 1 2 3 4 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 subgroup symbol 883 method case 2 measured terminal limits unit test no. v cc1 1y 1 y 1a 1b 1c 1d v ee 2a 2b 2c 2d 2e 2 y 2y v cc2 min max 1 v oh 3006 1 gnd ld 1 ld 1 v ih1 e 1 ld 1 ld 1 gnd 1y -0.930 -0.780 v tc = 25 c " 2 " " " v ih1 " " " " 1y " " " " 3 " " " v ih1 " " " " 1y " " " " 4 " " " v ih1 " " " " 1y " " " " 5 " " " " v ih1 " " " 2y " " " " 6 " " " " v ih1 " " " 2y " " " " 7 " " " " v ih1 " " " 2y " " " " 8 " " " " v ih1 " " " 2y " " " " 9 " " " " v ih1 " " " 2y " " " " 10 " " " v il1 " " " " 1 y " " " " 11 " " " v il1 " " " " 1 y " " " " 12 " " " v il1 " " " " 1 y " " " " 13 " " " v il1 " " " " 1 y " " " " 14 " " " " v il1 " " " 2 y " " " " 15 " " " " v il1 " " " 2 y " " " " 16 " " " " v il1 " " " 2 y " " " " 17 " " " " v il1 " " " 2 y " " " " 18 " " " " v il1 " " " 2 y " " " 2 same tests and terminal conditions as for subgroup 1, except tc = -125 c and limits as shown. -0.825 -0.630 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.080 -0.880 v 1 v ol 3007 19 gnd ld 1 ld 1 v il1 " ld 1 ld 1 gnd 1y -1.850 -1.620 v tc = 25 c " 20 " " " v il1 " " " " 1y " " " " 21 " " " v il1 " " " " 1y " " " " 22 " " " v il1 " " " " 1y " " " " 23 " " " " v il1 " " " 2y " " " " 24 " " " " v il1 " " " 2y " " " " 25 " " " " v il1 " " " 2y " " " " 26 " " " " v il1 " " " 2y " " " " 27 " " " " v il1 " " " 2y " " " " 28 " " " v ih1 e 1 " " " 1 y " " " " 29 " " " v ih1 " " " " 1 y " " " " 30 " " " v ih1 " " " " 1 y " " " " 31 " " " v ih1 " " " " 1 y " " " " 32 " " " " v ih1 " " " 2 y " " " " 33 " " " " v ih1 " " " 2 y " " " " 34 " " " " v ih1 " " " 2 y " " " " 35 " " " " v ih1 " " " 2 y " " " " 36 " " " " v ih1 " " " 2 y " " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -1.820 -1.545 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.920 -1.655 v 1 v oth 37 gnd ld 1 ld 1 v ith e 1 ld 1 ld 1 gnd 1y -0.950 v 38 " " " v ith " " " " 1y " " 39 " " " v ith " " " " 1y " " 40 " " " v ith " " " " 1y " " 41 " " " " v ith " " " 2y " " 42 " " " " v ith " " " 2y " " 43 " " " " v ith " " " 2y " " 44 " " " " v ith " " " 2y " " 45 " " " " v ith " " " 2y " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -0.845 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.100 v 34 mil-m-38510/60b
table iii. group a inspection for device type 06 - continued. for terminal conditions see table iiia. terminal s not designated are open. case e 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 mil-std- case f 5 6 7 8 9 10 11 12 13 14 15 16 1 2 3 4 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 subgroup symbol 883 method case 2 measured terminal limits unit test no. v cc1 1y 1 y 1a 1b 1c 1d v ee 2a 2b 2c 2d 2e 2 y 2y v cc2 min max 1 v oth 46 gnd ld 1 ld 1 v itl e 1 ld 1 ld 1 gnd 1 y -0.950 v tc = 25 c 47 " " " v itl " " " " 1 y " " 48 " " " v itl " " " " 1 y " " 49 " " " v itl " " " " 1 y " " 50 " " " " v itl " " " 2 y " " 51 " " " " v itl " " " 2 y " " 52 " " " " v itl " " " 2 y " " 53 " " " " v itl " " " 2 y " " 54 " " " " v itl " " " 2 y " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -0.845 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.100 v 1 v otl 55 gnd ld 1 ld 1 v itl e 1 ld 1 ld 1 gnd 1y -1.600 v tc = 25 c 56 " " " v itl " " " " 1y " " 57 " " " v itl " " " " 1y " " 58 " " " v itl " " " " 1y " " 59 " " " " v itl " " " 2y " " 60 " " " " v itl " " " 2y " " 61 " " " " v itl " " " 2y " " 62 " " " " v itl " " " 2y " " 63 " " " " v itl " " " 2y " " 64 " " " v ith " " " " 1 y " " 65 " " " v ith " " " " 1 y " " 66 " " " v ith " " " " 1 y " " 67 " " " v ith " " " " 1 y " " 68 " " " " v ith " " " 2 y " " 69 " " " " v ith " " " 2 y " " 70 " " " " v ith " " " 2 y " " 71 " " " " v ith " " " 2 y " " 72 " " " " v ith " " " 2 y " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -1.525 v 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -1.635 v 1 tc = 25 c i ee 3005 73 gnd e 1 v ee -14 ma 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. -16 ma 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. -16 ma 1 i ih1 3009 74 gnd v ih1 e 1 gnd 1a 265 a tc = 25 c " 75 " v ih1 " " 1b " " " 76 " v ih1 " " 1c " " " 77 " v ih1 " " 1d " " " 78 " " v ih1 " 2a " " " 79 " " v ih1 " 2b " " " 80 " " v ih1 " 2c " " " 81 " " v ih1 " 2d " " " 82 " " v ih1 " 2e " " 2 same tests and terminal conditions as for subgroup 1, except tc = 125 c and limits as shown. 450 a 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. 450 a 35 mil-m-38510/60b
table iii. group a inspection for device type 06 - continued. for terminal conditions see table iiia. terminal s not designated are open. case e 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 mil-std- case f 5 6 7 8 9 10 11 12 13 14 15 16 1 2 3 4 2 3 4 5 7 8 9 10 12 13 14 15 17 18 19 20 subgroup symbol 883 method case 2 measured terminal limits unit test no. v cc1 1y 1 y 1a 1b 1c 1d v ee 2a 2y 2 y 3 y 3y 2 y 2y v cc2 min max 1 i il 3009 83 gnd v il1 e 1 gnd 1a 0.5 a tc = 25 c " 84 " v il1 " " 1b " " " 85 " v il1 " " 1c " " " 86 " v il1 " " 1d " " " 87 " " v il1 " 2a " " " 88 " " v il1 " 2b " " " 89 " " v il1 " 2c " " " 90 " " v il1 " 2d " " " 91 " " v il1 " 2e " " 2 same tests and terminal conditions as for subgroup 1, except tc = -125 c and limits as shown. 0.3 a 3 same tests and terminal conditions as for subgroup 1, except tc = -55 c and limits as shown. 0.5 a t tlh 3004 92 e 3 out ld 2 in e 2 ld 2 ld 2 e 3 1y 1.1 3.3 ns " 93 " ld 2 out in " " " " 1 y " " " " 94 " " ld 2 " in " out " 2y " " " " 95 " " " " in out ld 2 " 2 y " " " 10 same tests and terminal conditions as for subgroup 9, except tc = -125 c and limits as shown. 1.0 4.0 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 4.0 ns 9 t thl 3004 96 e 3 out ld 2 in e 2 ld 2 ld 2 e 3 1y 1.1 3.3 ns tc = 25 c " 97 " ld 2 out in " " " " 1 y " " " " 98 " " ld 2 " in " out " 2y " " " " 99 " " " " in out ld 2 " 2 y " " " 10 same tests and terminal conditions as for subgroup 9, except tc = -125 c and limits as shown. 1.0 4.0 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 4.0 ns 9 t plh 3003 100 e 3 out ld 2 in e 2 ld 2 ld 2 e 3 1y 1.0 2.9 ns tc = 25 c " 101 " ld 2 out in " " " " 1 y " " " " 102 " " ld 2 " in " out " 2y " " " " 103 " " " " in out ld 2 " 2 y " " " 10 same tests and terminal conditions as for subgroup 9, except tc = -125 c and limits as shown. 1.0 3.7 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 3.7 ns 9 t phl 3003 104 e 3 out ld 2 in e 2 ld 2 ld 2 e 3 1y 1.0 2.9 ns tc = 25 c " 105 " ld 2 out in " " " " 1 y " " " " 106 " " ld 2 " in " out " 2y " " " " 107 " " " " in out ld 2 " 2 y " " " 10 same tests and terminal conditions as for subgroup 9, except tc = 125 c and limits as shown. 1.0 3.7 ns 11 same tests and terminal conditions as for subgroup 9, except tc = -55 c and limits as shown. 1.0 3.7 ns 36 mil-m-38510/60b
mil-m-38510/60b 37 5. packaging 5.1 packaging requirements. for acquisition purposes, the packaging requirements shall be as specified in the contract or order (see 6.2). when actual packaging of mate riel is to be performed by dod or in-house contractor personnel, these personnel need to contact the responsible packaging activity to ascertain packaging requirements. packaging requirements are maintained by the inventory control point's packaging activity within the military service or defense agency, or within the milit ary service's system command. packaging data retrieval is available from the managing military department's or defense agency's autom ated packaging files, cd-rom products, or by contacting the responsible packaging activity. 6. notes (this section contains information of a general or explanatory nature that may be helpful, but is not mandatory.) 6.1 intended use. microcircuits conforming to this specificat ion are intended for original equipment design applications and logistic support of existing equipment. 6.2 acquisition requirements. acquisition documents should specify the following: a. title, number, and date of the specification. b. pin and compliance identifier, if applicable (see 1.2). c. requirements for delivery of one copy of the c onformance inspection data pertinent to the device inspection lot to be supplied with each shipment by the device manufacturer, if applicable. d. requirements for certificate of compliance, if applicable. e. requirements for notification of change of product or process to contracting activity in addition to notification to the qualifying activity, if applicable. f. requirements for failure analysis (including required test condition of method 5003 of mil-std-883), corrective action, and reporting of results, if applicable. g. requirements for product assurance options. h. requirements for special carriers, lead lengths, or lead forming, if applicable. these requirements should not affect the part number. unless otherwise specified, these requirements will not apply to direct purchase by or direct shipment to the government. i. requirements for "jan" marking. j. packaging requirements (see 5.1). 6.3 superseding information . the requirements of mil-m-38510 have been superseded to take advantage of the available qualified manufacturer listing (qml) system provided by mil-prf-38535. previous references to mil-m- 38510 in this document have been replaced by appropriate re ferences to mil-prf-38535. all technical requirements now consist of this specification and mil-prf-38535. the mil-m-38510 specification sheet number and pin have been retained to avoid adversely impacting existing government logistics systems and contractor's parts lists. 6.4 qualification . with respect to products requiring qualification, awards will be made only for products which are, at the time of award of contract, qualified for inclus ion in qualified manufacturers list qml-38535 whether or not such products have actually been so listed by that date. the attention of the contractors is called to these requirements, and manufacturers are urged to arrange to have the products that they propose to offer to the federal government tested for qualification in order that they may be eligible to be awarded contracts or purchase orders for the products covered by this specification. information pertaining to qualification of products may be obtained from dscc-vq, p.o. box 3990, columbus, ohio 43218-3990.
mil-m-38510/60b 38 6.5 abbreviations, symbols, and definitions. the abbreviations, symbols, and definitions used herein are defined in mil-prf-38535, mil-hdbk-1331, and as follows: gnd ............................................ gr ound zero voltage potential v oth ............................................. high-le vel threshold output voltage v otl ............................................. low-leve l threshold output voltage v ith .............................................. high-le vel threshold input voltage v itl .............................................. low-leve l threshold input voltage v eel ............................................. shifted power supply voltage for the purpose of ac testing t j ................................................ circuit junction temperature t c ................................................ case operating temperature p d ................................................ circuit power dissipation ja ................................................ junction to ambient thermal resistance in c per watt jc ................................................ junction to case thermal resistance 6.6 logistic support. lead materials and finishes (see 3.4) are interchangeable. unless otherwise specified, microcircuits acquired for government logistic support will be acquired to device class b (see 1.2.2), lead material and finish a (see 3.4). longer length leads and lead forming should not affect the part number. 6.7 substitutability. the cross-reference information below is presented for the convenience of users. microcircuits covered by this specification will functionally replace the listed generic-industry type. generic-industry microcircuit types may not have equiv alent operational performance charac teristics across military temperature ranges or reliability factors equivalent to mil-m-35810 device types and may have slight physical variations in relation to case size. the presence of this information should not be deemed as permitting substitution of generic-industry types for mil-m-38510 types or as a waiver of any of the provisions of mil-prf-38535. military device type generic-industry type 01 10501 02 10502 03 10505 04 10506 05 10507 06 10509 6.8 environmental variations versus device testing and operation . different nominal values of air velocity and temperature may be selected for device tests and in-system operation. however, when this occurs or when air velocity and temperature gradients cause a shi ft in device junction temperature greater than 2 c, the device output voltages and input forcing functions assume significant new values. based on the typical thermal resistance curve of figure 7, the new values can be determined from the procedures in 6.8.1. 6.8.1 procedures for determining new values of device output voltage and input forcing function . a. determine device power dissipation by power supply drain current and the following equation: p d (max) = i ee (max) x v ee + 9.7 mw x number of outputs. b. using this maximum power dissipation, enter figures 4 and 5 as applicable for the case outline and determine the junction temperature deviation ( ? t j ) for the selected nominal air velocity. c. if the actual ambient test or system temperatures are other than those specified (-55 c, 25 c, 125 c), the difference between the actual and specified values shall be algebraically added to the ? t j for the air velocity determined in (b) above to obtain a ? t j (total).
mil-m-38510/60b 39 d. using the appropriate adjustment coefficients from figure 6 multiplied by the ? t j (total), determine the correct amount of compensation to be applied to each of the forcing functions and voltage limits under the actual test or system conditions. (see 6.8.2 for two examples of determining compensation) 6.8.2 test limit compensation examples . a. a device which has a power dissipation of 100 mw in case f is to be tested under a zero airflow condition. on figure 5, ? t j between 500 linear ft/min and zero airflow is +4 c. in order to adjust the various parameter limits, use figure 6 which defines the limit adjustment coefficients for ? t j . to adjust v oh (max) at -55 c, use the + ? t j column of the -55 c portion of figure 6 and locate the coefficient corresponding to v oh (max). this value is 1.38 mv/ c. multiply the ? t j by the coefficient and algebraically add it to the -55 c v oh (max) limit from table iii. v oh (max) (adjusted limit) = (+4 c) x (1.38 mv/ c) + (-830 mv) = 5.52 mv -830mv = -824.48 mv use ?824 mv follow the same procedure to adjust the remaining parameters at -55 c as well as all parameters at 25 c and 125 c. b. a device with a power dissipation of 150 mw in case e is to be tested at an airf low of 200 linear ft/min and the 25 c testing is to be accomplished at an ambient temperature of +20 c. on figure 4 ? t j due to airflow is +2 c. the ? t j due to ambient temperature change is -5 c (25-20). therefore the total ? t j = -5 +2 = -3 c. using figure 6 find the 25 c, - ? t j column. to adjust the v ol (max) locate the limit coefficient corresponding to v ol (max) for a negative ? t j , this value is 0.44 mv/ c. multiply the ? t j by the coefficient and algebraically add it to the +25 c v ol (max) limit from table iii. v ol (max) (adjusted limit) = (-3 c) x (0.44 mv/ c) + (-1620 mv) = 1.32 mv ? 1620 mv = -1621.32 mv use ? 1621 mv follow the same procedure to adjust the remaining parameters at +25 c. 6.8.3 maximum junction temperature . under no circumstance should the devices be operated in an environment such that t j as calculated by the following equation be allowed to exceed the maximum junction temperature of 1.3. t j = t c + j a (typ) x p d (max). typical junction to ambient thermal resistance j a (typ) varies as a function of air velocity as shown on figure 7. 6.9 changes from previous issue. marginal notations are not used in this revision to identify changes with respect to the previous issue due to the extensiveness of the changes. custodians: preparing activity: army - cr dla - cc navy - ec air force - 11 (project 5962-2068) dla - cc review activities: army - mi, sm navy - as, cg, mc, sh, td air force - 03, 19, 99 note: the activities listed above were interested in th is document as of the date of this document. since organizations and responsibilities can change, you should verify the currency of the information above using the assist online database at http://assist.daps.dla.mil .

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